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Effect of grain size on springback and system energy in micro V-bending with phosphor bronze foil

机译:磷青铜箔微V型弯曲中晶粒尺寸对回弹和系统能量的影响

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摘要

In this paper, the effect of grain size on springback in the micro V-bending process of phosphor bronze foil (face-centered cubic structure) is investigated. Grain size effect is expressed by the ratio of material thickness (T) to average grain size (D), and these T/D values are divided into three groups: larger than 1, less than 1, and approximately equal to 1. It has been found that springback angles were the lowest when T/D ≈ 1. Electron backscattering diffraction (EBSD) measurement results show that the twinning boundaries change with the ratios of T/D before and after bending. When T/D \u3e 1, the high relative frequency of Σ3 implies that the specimen has a high system energy, which can result in large springback behavior. The equal relative frequencies of Σ3 for specimens with three ratios also prove that twinning boundaries can be regarded as an indicator of system energy. The effect of grain size on grain reorientation during bending is also discussed, and it was found that the least quantities of high surface energy {110} planes in the T/D ≈ 1 material could contribute to the least springback angles.
机译:在本文中,研究了晶粒尺寸对磷青铜箔(面心立方结构)的微V弯曲过程中回弹的影响。晶粒尺寸效应由材料厚度(T)与平均晶粒尺寸(D)之比表示,并且这些T / D值分为三组:大于1,小于1和大约等于1。结果表明,当T / D≈1时,回弹角最低。电子背散射衍射(EBSD)测量结果表明,孪晶边界随弯曲前后T / D的比值而变化。当T / D \ u3e 1时,Σ3的较高相对频率表示该标本具有较高的系统能量,这可能导致较大的回弹行为。对于具有三个比率的样本,Σ3的相对相对频率相等,这也证明孪生边界可以视为系统能量的指标。还讨论了晶粒尺寸对弯曲过程中晶粒重新定向的影响,并且发现在T / D≈1材料中最少数量的高表面能{110}平面可以贡献最小的回弹角。

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